High-Frequency (RF) Test Sockets

	DESCRIPTION	DATA SHEET PDF

	RF Test Sockets w/Replaceable Contact Strips These sockets use our patented Microstrip™ contacts which lie flat on the DUT board and become part of the transmission line. Self-inductance as low as 0.01nH and Frequency Response to 19GHz. GET AN “INSTA-QUOTE”	24001

	Thermoelectric-cooled RF Test Socket Peltier Technology is incorporated into test socket lid assembly. The thermoelectric cooler (TEC) provides fast and accurate temperature control, while the built-in epoxy-encapsulated thermistor maintains a highly-accurate temperature sensing of ±0.02°C. GET AN “INSTA-QUOTE”	24002

	High-Frequency Interposer Socket Now you can get the best of both worlds! The Kapton Interposer socket gives you the High-frequency characteristics of our Microstrip™ Contact Socket combined with the close component placement of our Spring Probe Sockets. Signal paths can be as short as 0.008" [0.203mm] while the pad layouts can be identical to the package footprint. GET AN “INSTA-QUOTE”	24007

	High-Frequency Center Probe Test Socket for Devices up to 6.5mm Square GET AN “INSTA-QUOTE”	24013

	High-Frequency Center Probe™ Test Socket for Devices up to 13mm Square For test & dynamic burn-in of CSP, µBGA, DSP, LGA, SRAM, DRAM and Flash devices on any pitch of 0.40mm pitch or higher. This socket is easily mounted and removed to & from the PCB due to solderless pressure-mount compression spring probes. GET AN “INSTA-QUOTE”	24008

	High-Frequency Center Probe™ Test Socket for Devices from 14 to 27mm Square Our answer for a reliable Area Array Package socket. Our unique style of probes will work for any application. Available pitches down to 0.5mm with Frequency Response over 10GHz! GET AN “INSTA-QUOTE”	24009

	High-Frequency Center Probe™ Test Socket w/Adjustable Pressure Pad for Devices up to 27mm Square	24009-APP

	Machined High-Frequency Center Probe Test Socket for BGA, CSP & MLF Packages Our answer for a reliable Area Array Package socket. Our unique style of probes will work for any application. Available pitches down to 0.5mm with Frequency Response over 10GHz! GET AN “INSTA-QUOTE”	24010

	High-Frequency Center Probe™ Test Socket for Devices up to 40mm Square For high-frequency Testing & Burn-In of CSP, µBGA, DSP, LGA, SRAM, DRAM and Flash Devices on any pitch device on 0.40mm or larger. The 4-point Crown insures “scrub” on solder oxides. GET AN “INSTA-QUOTE”	24011

	High-Frequency Center Probe™ Test Socket for Devices up to 55mm Square For high-frequency testing of CSP, BGA, DSP, LGA, SRAM, DRAM, and Flash devices on any pitch of 0.50mm or larger. The four-point crown insures “scrubbing” of solder oxides, while pointed probe works with LGA’s, MLF’s, etc. GET AN “INSTA-QUOTE”	24012

	Kelvin Test Socket	23022



	RF TEST SOCKETS FEATURED ARTICLES

CLEANING PROCEDURE (Download PDF Version)	RF SOCKETS PRESENTATION

LOADBOARD DESIGN GUIDELINES	NEW TRENDS IN SOCKETS WEBCAST Originally broadcast October 6, 2005, featuring Aries Electronics’ own RF Product Manager Bruce DeChillo. This Webinar will cover Lead-free Socket specifics, High-performance Sockets, Low-contact Resistance Sockets, and Sockets – all from a business perspective.

RF CENTER PROBE™ CONTACT Signal Path Length: as short as 0.077" Operating Temperature: -55°C to +150°C Insertions: >500,000 Self-Inductance: 0.51nH Bandwidth: 18.0GHz at -1dB (0.5mm pitch) Contact Resistance: <70 milliohms	RF MICROSTRIP™ CONTACT Signal Path Length: 0.005" and 0.007" Operating Temperature: -55°C to +150°C Insertions: 500,000 Self-Inductance: 0.01nH Bandwidth: 16GHz at -1dB (0.50mm pitch) Contact Resistance: <70 milliohms
RF INTERPOSER Signal Path Length: as short as 0.011" Operating Temperature: -55°C to +150°C Insertions: >50,000 Self-Inductance: 0.09nH Bandwidth: 40GHz at -1dB Contact Resistance: <40 milliohms	RF CENTER PROBE™ PinBall™ Signal Path Length: 1) 0.139" (3.5mm) for 0.50mm and 0.65mm pitch 2) 0.202" (0.51mm) for 0.80mm pitch and higher Operating Temperature: -55°C to +150°C Insertions: >10,000 Contact Resistance: <60 milliohms

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High-Frequency (RF) Test Sockets