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CSP/µBGA Test & Burn-In Socket for Devices Up to 6.5mm Square

CSP/MicroBGA Test & Burn-In Socket for Devices Up to 6.5mm Sq.
CUSTOMIZATION: In addition to the standard products shown on this page, Aries specializes in custom design and production. Special materials, platings, sizes, and configurations can be furnished, depending on quantity. NOTE: Aries reserves the right to change product specifications without notice.
FEATURES

  • For Test & Burn-In of CSP, µBGA, DSP, LGA, SRAM, DRAM and Flash Devices. Consult factory for QFP applications
  • Any pitch device on 0.30mm pitch or higher
  • Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with two stainless steel screws
  • The Au over Ni plated compression spring probes leave very small witness marks on the bottom surface of the device solder balls
  • Small overall socket size/profile allows max. number of sockets per BIB and BIB’s per oven, while being operator friendly
  • Standard molded socket format can accommodate any device package of 6.5mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers
  • Pressure pad compression spring provides proper force against device and allows for height variations in device thickness
  • 4-point crown insures “scrub” on solder oxides
  • Signal path during test only 0.077 [1.96]

GENERAL SPECIFICATIONS

  • MOLDED SOCKET COMPONENTS: UL 94V-0 Ultem
  • MACHINED SOCKET COMPONENTS: UL 94V-0 PEEK or Torlon
  • HARDWARE: Stainless Steel
  • COMPRESSION SPRING PROBES: heat-treated BeCu
  • COMPRESSION PIN PROBE PLATING: 30µ min. [0.75µ] Au per MIL-G-45204 over 30µ min. [0.75µ] Ni per SAE AMS-QQ-N-290B
  • DURABILITY: 500,000 cycles min.
  • CONTACT FORCE:
    : 15g per contact on 0.30-0.35mm pitch
    : 16g per contact on 0.40-0.45mm pitch
    : 25g per contact on 0.50-0.75mm pitch
    : 25g per contact on 0.80mm pitch or larger
  • OPERATING TEMPERATURE: -55°C [-67°F ] min. to 150°C [302°F] max.
  • TYPICAL AVERAGE BURN-IN TEMPERATURE: 150°C max.

MOUNTING CONSIDERATIONS

  • See “PCB FOOTPRINT TOP VIEW” for requirements.
  • REQUIRES: two #0-80 screws (supplied) and PEM nuts for mounting (not supplied). Mounting holes size shown may differ depending on PEM nut selected
  • NOTE: Sockets must be handled with care when mounting or removing sockets to/from BIB to avoid damaging sensitive spring contacts.
  • TEST PCB DIA. "G": 0.025 [0.64] (large probe 0.80mm pitch and larger)
    : 0.015 [0.38] (small probe 0.50-0.75mm pitch)
    : 0.012 [0.31] (small probe 0.40-0.45mm pitch)
    : 0.009 [0.23] (small probe 0.30-0.35mm pitch)
  • TEST PCB DIA. SPRING PROBE PAD PLATING: 30µ min. [0.75µ] Au per MIL-G-45204 over 30µ [0.75µ] min. Ni per SEA AMS-QQ-N-290. Pad must be the same height as top surface of PCB. Please refer to the Custom Socket Drawing supplied by Aries after receipt of your order for your specific application.

TEST REPORTS

 

NOTICE   ORDERING INFORMATION

ALL DIMENSIONS: INCHES [MILLIMETERS]

ALL TOLERANCES: ±0.005 [0.13] UNLESS OTHERWISE SPECIFIED

FACTORY WILL SUPPLY SOCKET DRAWING WITH “A-H” DIMENSIONS. LEGIBLE DIMENSIONED DEVICE DRAWING REQUIRED AT QUOTE REQUEST AND TIME OF ORDER.

CONSULT FACTORY FOR OTHER SIZES AND CONFIGURATIONS

PRINTOUTS OF THIS DOCUMENT MAY BE OUT-OF-DATE AND SHOULD BE CONSIDERED UNCONTROLLED

 

Consult Factory or...

GET AN “INSTA-QUOTE”

 

See Also Data Sheet...
  23021 µBGA up to 6.5mm
  23017 µBGA up to 13mm
  23018 µBGA up to 27mm
  23018-APP w/Adj Pressure Pad
  23019 µBGA up to 40mm
  23020 µBGA up to 55mm
  24013 RF up to 6.5mm
  24008 RF up to 13mm
  24009 RF up to 27mm
  24011 RF up to 40mm
  24012 RF up to 55mm
  23016 CSP/BallNest™ Hybrid
  24010 RF Machined Socket
  23022 Kelvin Test Socket
Reference-only Drawing for CSP/MicroBGA Test & Burn-In Socket for Devices Up to 6.5mm Sq.
23021 Spring Probes

 

Download Data Sheet 23021, Rev AA