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CUSTOMIZATION: IN ADDITION TO THE STANDARD PRODUCTS SHOWN ON THIS PAGE, ARIES SPECIALIZES IN CUSTOM DESIGN AND PRODUCTION. SPECIAL MATERIALS, PLATINGS, SIZES, AND CONFIGURATIONS CAN BE FURNISHED, DEPENDING ON QUANTITY. NOTE: ARIES RESERVES THE RIGHT TO CHANGE PRODUCT SPECIFICATIONS WITHOUT NOTICE.

High-Frequency Center Probe™ Test Socket w/Adjustable Pressure Pad for Devices up to 27mm Square

FEATURES

• For Test & Dynamic Burn-In of CSP, µBGA, DSP, LGA, SRAM, DRAM and Flash Devices
• Any pitch device on 0.30mm to or larger
• Pressure mounting, no soldering required
• 4 Point crown (other styles also available) insures scrub on solder oxides
• Signal path during test only 0.077 [1.96]
• Accommodates any package up to 27mm square
• Small overall socket size/profile allows max. number of sockets per BIB and BIB’s per oven, while being operator-friendly
• Adjustable pressure pad, with a large tolerance, allows for varying device heights as well as for fine-tuning pressure pad force to meet specific device requirements

GENERAL SPECIFICATIONS

• MOLDED SOCKET COMPONENTS: UL 94V-0 PEEK and/or Ultem
• PIN INDUCTANCE: 0.51nH (large probe)
• CONTACT RESISTANCE: <40 mΩ
• 1dB BANDWIDTH: 10.1GHz (0.80mm pitch) (large probe)
• ESTIMATED CONTACT LIFE: 500,000 cycles
• COMPRESSION SPRING PROBES: heat-treated BeCu with 30µ min. [0.75µ] Au per MIL-G-45204 over 30µ min. [0.75µ] Ni per SAE AMS-QQ-N-290B
• CONTACT FORCE:
  : 5g per contact on 0.30-0.35mm pitch
  : 16g per contact on 0.40-0.45mm pitch
  : 25g per contact on 0.50-0.75mm pitch
  : 25g per contact on 0.80mm pitch or larger
• OPERATING TEMPERATURE: -55°C [-67°F] min. to 150°C [302°F] max.
• ALL HARDWARE: Stainless Steel

MOUNTING CONSIDERATIONS

• Socket is mounted with four #4-40 screws (to be removed at time of socket mounted to PCB) or a tapped, insulated backing plate to be used on underside of PCB for high pin count applications
• Sockets must be handled with care when mounting or removing sockets to/from PCB
• TEST PCB DIA. "G": 0.025 [0.64] (large probe 0.80mm pitch and larger)
  : 0.015 [0.38] (small probe 0.50-0.75mm pitch)
  : 0.012 [0.31] (small probe 0.40-0.45mm pitch)
  : 0.009 [0.23] (small probe 0.30-0.35mm pitch)
• TEST PCB DIA. SPRING PROBE PAD PLATING: 30µ min. [0.75µ] Au per MIL-G-45204 over 30µ [0.75µ] min. Ni per SEA AMS-QQ-N-290. Pad must be the same height as top surface of PCB. Please refer to the Custom Socket Drawing supplied by Aries after receipt of your order for your specific application.

TEST REPORTS

Select Test Report... 0.50mm Center Probe™ Test Contact 0.50mm Center Probe™ Test Contact Return Loss Graph 0.80mm Center Probe™ Test Contact 0.80mm Center Probe™ Test Contact Return Loss Graph Center Probe™ CSP DC Measurements w/Cycling Center Probe™ CSP RF Measurements w/Cycling Center Probe™ CSP DC Measurements w/o Cycling Center Probe™ CSP RF Measurements w/o Cycling

 

NOTICE		ORDERING INFORMATION
ALL DIMENSIONS: INCHES [MILLIMETERS] ALL TOLERANCES: ±0.005 [0.13] UNLESS OTHERWISE SPECIFIED CONSULT FACTORY FOR OTHER SIZES AND CONFIGURATIONS PRINTOUTS OF THIS DOCUMENT MAY BE OUT-OF-DATE AND SHOULD BE CONSIDERED UNCONTROLLED		Consult Factory Also See Data Sheets...   23021 µBGA up to 6.5mm   23017 µBGA up to 13mm   23018 µBGA up to 27mm   23018-APP w/Adj Pressure Pad   23019 µBGA up to 40mm   23020 µBGA up to 55mm   24013 RF up to 6.5mm   24008 RF up to 13mm   24009 RF up to 27mm   24011 RF up to 40mm   24012 RF up to 55mm   23016 CSP/BallNest™ Hybrid   24010 RF Machined Socket   23022 Kelvin Test Socket

 

Download Data Sheet 24009-APP, Rev AA