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采用Center Probe™专利技术,机械加工而成的高频测试插座,适合BGA, CSP, 和 MLF等封装的器件

Machined High-Frequency Center probe Test Socket for BGA, CSP, & MLF Packages
CUSTOMIZATION: IN ADDITION TO THE STANDARD PRODUCTS SHOWN ON THIS PAGE, ARIES SPECIALIZES IN CUSTOM DESIGN AND PRODUCTION. SPECIAL MATERIALS, PLATINGS, SIZES, AND CONFIGURATIONS CAN BE FURNISHED, DEPENDING ON QUANTITY. NOTE: ARIES RESERVES THE RIGHT TO CHANGE PRODUCT SPECIFICATIONS WITHOUT NOTICE.
特点

  • 无需焊锡通过压力固定到测试板上,器件的焊锡球或者焊盘
  • 测试期间信号通道仅为0.077 [1.96]
  • 插座的电感和电容都非常低
  • 小巧的外形使测试板可以更加被充分的利用
  • 芯片导向器使器件可是实现更精确的接触
  • 受载弹簧接触可以让插座拥有更高的寿命
  • 4点公接头使得接插时更为精确
  • 插座的定位销使插座可以更精确的连接到PCB上
  • 底部接触使得PCB板中心位置上可以有通孔
  • 适用于pitch大于0.3mm的器件

规格

  • 插座材料:Torlon PAI
  • 所有硬件部分:不锈钢
  • 受载弹簧:镀金的铍铜
  • 接触电阻:<40 mΩ
  • 适合焊锡球的尺寸:0.15mm-0.93mm
  • 预测寿命:500,000次
  • 接触力:
    : 15g每根针上,当pitch为0.30-0.35mm
    : 16g每根针上,当pitch为0.40-0.45mm
    : 25g每根针上,当pitch为0.50-0.75mm
    : 25g每根针上,当pitch大于0.80mm时
  • 探针自感:0.51nH (大探针); 0.59nH (小探针)
  • 插入损耗:当信号频率最高到10.1GHz时,损耗为1dB,(larger probe @ 0.80mm pitch); 当信号频率最高到18.7GHz时,损耗为1dB (smaller probe @ 0.50mm pitch)

安装注意事项

  • 建议定位孔尺寸:0.063 [1.6mm],2个
  • 建议安装孔尺寸:0.120 [3.05mm],4个;配合四颗4-40螺丝
  • 测试PCB DIA. "G": 0.025 [0.64] (large probe 0.80mm pitch and larger)
    : 0.015 [0.38] (small probe 0.50-0.75mm pitch)
    : 0.012 [0.31] (small probe 0.40-0.45mm pitch)
    : 0.009 [0.23] (small probe 0.30-0.35mm pitch)
  • 弹簧探针电镀:采用镍底镀金的办法,按照MIL-G-45204标准至少镀金30µ,按照SAE AMS-QQ-N-290B标准至少镀镍30µ。Pad在高度上必须和PCB的表面相同。Aries在收到您的订单之后会为您提供专门的定制插座图纸,供您参考

TEST REPORTS

 

请注意   ORDERING INFORMATION

所有尺寸用英寸[毫米]。其它尺寸,外形请咨询工厂。所有公差在±0.005 [±0.13]内,除非另有详细说明。器件图纸请送到Aries以便取得报价和设计图纸。以上文档信息仅供参考,实际产品以报价或图纸中的说明为准。

 

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Also See Data Sheets...
  23021 µBGA up to 6.5mm
  23017 µBGA up to 13mm
  23018 µBGA up to 27mm
  23018-APP w/Adj Pressure Pad
  23019 µBGA up to 40mm
  23020 µBGA up to 55mm
  24013 RF up to 6.5mm
  24008 RF up to 13mm
  24009 RF up to 27mm
  24011 RF up to 40mm
  24012 RF up to 55mm
  23016 CSP/BallNest™ Hybrid
  24010 RF Machined Socket
  23022 Kelvin Test Socket

“-24HL” HINGED LID VERSION SHOWN

“-24DL” DOUBLE-LATCHED REMOVABLE LID VERSION SHOWN

“-24HL” HINGED LID VERSION SECTION

Spring Probes for Machined High-Frequency Center Probe™ Test Socket for BGA, CSP, & MLF Packages

 

Download Data Sheet 24010, Rev AA