Aries Electronics Awarded “Best Presentation, Tutorial in Nature” at BiTS 2013
BRISTOL, PA – Aries Electronics, a US manufacturer of standard, programmed and custom interconnection products – burn-in and test sockets used worldwide, was awarded “Best Presentation – Tutorial in Nature” for the paper entitled “Anatomy of a Test Socket” which was authored and presented by Paul Ruo (VP Sales and Marketing) at the annual Burn-in & Test Strategies Workshop (BiTS), held March 3-8 in Mesa, Arizona.
The presentation focused on the components and construction of burn-in and test sockets from concept through assembly. It was produced to help educate those in associated industries who may lack an appreciation for all the steps and intricacies necessary to manufacture a burn-in or test socket.
Suppliers and burn-in and test socket users from all over the world gather each year at the annual BiTS Expo to share what is Now & Next in burn-in and test tooling products and services.
Pictured during the award presentation ceremony are (left to right); Fred Tabor, Chairman of BiTS Workshop, Paul Ruo, VP Sales and Marketing, Aries Electronics and Mike Noel, BiTS Committee Member. See presentation here.
For additional information, contact Frank Folmsbee, Aries Electronics, Inc., 2609 Bartram Road, Bristol, PA 19007-6810; Tel: 215-781-9956; Fax: 215-781-9845; Email: firstname.lastname@example.org
EDITOR'S NOTE: From its Bristol, PA facility, Aries Electronics, Inc. manufactures an extremely broad range of custom and standard interconnection and packaging products used worldwide for a variety of electronics applications.
Industry leading products include Zero Insertion Force (ZIF) test sockets for DIP, PGA, BGA, QFN, QFP and SOIC devices; the “intelligent” Correct-A-Chip® product line; adapters and connectors; several patented concepts for BGA (ball grid array) and LGA (land grid array) sockets; and an extensive array of high frequency test and burn in sockets. The company also specializes in meeting custom requirements for its customers.