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CSP Test Socket for Optical Laser Failure Analysis w/ Emission Microscopy
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High-Frequency Center Probe Test Socket for Devices up to 13mm Square
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High-Frequency Center Probe Test Socket for Devices up to 27mm Square
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High-Frequency Center Probe Test Socket for Devices up to 40mm Square
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High-Frequency Center Probe Test Socket for Devices up to 55mm Square
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High-Frequency Center Probe Test Socket for Devices up to 6.5mm Square
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High-Frequency Center Probe Test Socket w/Adjustable Pressure Pad for Devices up to 27mm Square
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High-Frequency Interposer Socket
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Kelvin Test Socket
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Long-Life Hi-Frequency Sockets for BGA, LGA, QFN, MLCC, µBGA and Bumped Die Devices
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Machined High-Frequency Center Probe Test & Burn-in Socket for BGA, CSP, & MLF Packages
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RF Test Socket with Replaceable Contact Strips – Now Available in High-Temp 250°C Version
