New CSP Sockets Enable Testing of Any Area-array Device to +200°C
High-temp Sockets
now offers the industry's first CSP sockets that accept any area-array device for high-temperature testing up to +200°C. The new AR4HT Series sockets incorporate a low-profile 0.45 mm contact structure (compressed) that is shorter than other low-profile contacts and provides excellent compliance for reliable ATE testing and burn-in. (read more)
Machined High-Frequency Center Probe Test Sockets Now Available in Pitch Sizes Down to 0.30mm
Machined high-frequency center probe test sockets to accommodate IC devices with a lead pitch of 0.30mm. With very low inductance and capacitance, the sockets are ideal for a wide variety of BGA, CSP, and MLF packages. (read more)
Machined High-Frequency Center Probe Test Sockets Now Available in Pitch Sizes Down to 0.30mm
Machined high-frequency center probe test sockets to accommodate IC devices with a lead pitch of 0.30mm. With very low inductance and capacitance, the sockets are ideal for a wide variety of BGA, CSP, and MLF packages. (read more)